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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 03/08/21 | Keysight Technologies Electromagnetic Si | 2514 kB | 9 | Agilent | 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper |
| EMPro 3D EM Simulation Platform Support Roadmap 5991-0425EN c20140610 [1].pdf | EMPro 3D EM Simulation Platform Support Roadmap 5991-0425EN c20140610 [1].pdf | 01/02/20 | Keysight Technologies EMPro 3D EM Simu | 79 kB | 1 | Agilent | EMPro 3D EM Simulation Platform Support Roadmap 5991-0425EN c20140610 [1] |
| 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano | 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano | 04/07/21 | Keysight Technologies Three dimensional | 1667 kB | 5 | Agilent | 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano |
| 5990-4819EN Keysight EEsof EDA EMPro c20141029 [10].pdf | 5990-4819EN Keysight EEsof EDA EMPro c20141029 [10].pdf | 30/08/20 | Keysight EEsof EDA EMPro 3D Electromagne | 896 kB | 2 | Agilent | 5990-4819EN Keysight EEsof EDA EMPro c20141029 [10] |
| Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6].pdf | Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6].pdf | 29/08/20 | Keysight Technologies Scanning Microwave | 320 kB | 1 | Agilent | Scanning Microwave Microscope Mode - Application Note 5989-8818EN c20141205 [6] |
| 5991-3154EN Keysight EEsof EDA Premier Communications Design Software c20131008 [104].pdf | 5991-3154EN Keysight EEsof EDA Premier Communications Design Software c20131008 [104].pdf | 28/08/20 | Agilent EEsof EDA Premier Communications | 8612 kB | 1 | Agilent | 5991-3154EN Keysight EEsof EDA Premier Communications Design Software c20131008 [104] |
| 5989-7568EN Keysight EEsof EDA Premier Communications Design Software - Technical Overview c20141028 | 5989-7568EN Keysight EEsof EDA Premier Communications Design Software - Technical Overview c20141028 | 09/12/21 | Keysight Technologies EEsof EDA Premier | 991 kB | 2 | Agilent | 5989-7568EN Keysight EEsof EDA Premier Communications Design Software - Technical Overview c20141028 |
| 5965-7742E IC-CAP Device Modeling Software - Technical Overview c20141015 [13].pdf | 5965-7742E IC-CAP Device Modeling Software - Technical Overview c20141015 [13].pdf | 29/08/20 | Keysight Technologies IC-CAP Device Mode | 1050 kB | 1 | Agilent | 5965-7742E IC-CAP Device Modeling Software - Technical Overview c20141015 [13] |
| A081 Modeling for Capacity Planning in a Large Systems Environment; Dodge.pdf | A081 Modeling for Capacity Planning in a Large Systems Environment; Dodge.pdf | 11/05/21 | i5SHARE~ | 1391 kB | 1 | IBM | A081 Modeling for Capacity Planning in a Large Systems Environment; Dodge |
| manualst.txt | manualst.txt | 20/05/20 | 7624 Chassis:R8 AA European First rel | 1 kB | 1 | Philips | manualst |
| 5991-0400EN Model Builder Program (MBP) c20140722 [8].pdf | 5991-0400EN Model Builder Program (MBP) c20140722 [8].pdf | 20/01/20 | Keysight Technologies Model Builder Prog | 836 kB | 1 | Agilent | 5991-0400EN Model Builder Program (MBP) c20140722 [8] |
| FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4].pdf | FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4].pdf | 30/06/21 | Pr | 778 kB | 1 | Agilent | FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4] |
| 5980-1916E.pdf | 5980-1916E.pdf | 18/02/20 | Practical Noise-Figure Measurement and A | 1694 kB | 3 | HP | 5980-1916E |
| Graphene Studies_ Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene 59 | Graphene Studies_ Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene 59 | 04/10/21 | Graphene Studies Using Agilent Nanomeasu | 1410 kB | 1 | Agilent | Graphene Studies Utilization of Atomic Force Microscopy for Nanoscale Investigations of Graphene 59 |
| GH20-0368-3_Continous_System_Modeling_Program_Operators_Manual_1971.pdf | GH20-0368-3_Continous_System_Modeling_Program_Operators_Manual_1971.pdf | 18/03/20 | - - -- - - --- | 786 kB | 11 | IBM | GH20-0368-3 Continous System Modeling Program Operators Manual 1971 |
| H20-0368-2_Continous_System_Modeling_Program_Operators_Manual_1969.pdf | H20-0368-2_Continous_System_Modeling_Program_Operators_Manual_1969.pdf | 10/03/20 | -=-===:. - -- - .- | 778 kB | 1 | IBM | H20-0368-2 Continous System Modeling Program Operators Manual 1969 |
| 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8].pdf | 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8].pdf | 01/02/20 | Keysight 7500 AFM | 858 kB | 10 | Agilent | 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8] |
| 5990-4731EN SystemVue 2013 Technical Overview c20140904 [9].pdf | 5990-4731EN SystemVue 2013 Technical Overview c20140904 [9].pdf | 27/08/20 | Keysight EEsof EDA SystemVue 2013 | 292 kB | 1 | Agilent | 5990-4731EN SystemVue 2013 Technical Overview c20140904 [9] |
| Simulation and Measurement-based X-parameter Models for Power Amplifiers with Envelope Tracking 5991 | Simulation and Measurement-based X-parameter Models for Power Amplifiers with Envelope Tracking 5991 | 15/08/21 | Keysight Technologies Simulation and Mea | 673 kB | 2 | Agilent | Simulation and Measurement-based X-parameter Models for Power Amplifiers with Envelope Tracking 5991 |
| Digital Design & Interconnect Standards - Brochure 5990-5438EN c20140221 [16].pdf | Digital Design & Interconnect Standards - Brochure 5990-5438EN c20140221 [16].pdf | 15/12/19 | Digital Design & Interconnect Standards | 6630 kB | 2 | Agilent | Digital Design & Interconnect Standards - Brochure 5990-5438EN c20140221 [16] |